Come and meet our process experts at ICPT 2026.
We will showcase the DCM-10 Concentration Monitor for real-time, in-situ measurement of semiconductor wet chemicals. By measuring refractive index and providing temperature-compensated concentration values, DCM-10 turns chemical concentration changes into actionable information for process control.
From incoming chemical checks to wafer cleaning, chemical etching and chemical mechanical planarization (CMP), reliable concentration monitoring helps teams identify abnormal process behavior as it happens, improve process consistency and support higher wafer throughput.