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Manuals

• KxS Semiconductor concentration monitor DCM-10 manual
• KxS Inline Brix refractometer DCM-20 manual

Certificates

• 3-A Sanitary Standards Certificate 46-04
• EHEDG Certificate Type EL Class 1
• DNV Management System Certificate ISO 9001:2015

Technical Notes

• Technical note 1.01.01  Refractive Index measurement principle for process control

Applications

• KxS Application Insights Semiconductor CMP slurry Insights

• Slurry Delivery Systems Defining Incoming CMP Slurry Density and Achieving Target Process Conctration Driven by Inline Metrology Unify CMP Engineers - ICPT_2022

• Inline Refractive Index-based Slurry Density Monitoring to Optimize Raw CMP Slurry Container Dispersion - ICPT_2023
   
• Critical inline instrumentation integration aspects in dairy total solids
  and Brix concentration measurements in membrane filtration systems
   
• Application Note 2.01.01 CHO fermentation and cell/protein separation
• Application Note 5.03.01 Polymerization reaction/polymer slurry
• Application Note 5.03.03 Uses of Ethylene glycol in industrial operations
• Application Note 9.01.02 Spraying and recovery of aviation de-icing fluids